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HTS CodeDescription
9031Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof:
9031.10.00.00- Machines for balancing mechanical parts
9031.20.00.00- Test benches
- Other optical instruments and appliances:
9031.41.00- - For inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices
9031.41.00.20- - - For inspecting photomasks or reticles used in manufacturing semiconductor devices
- - - For inspecting semiconductor wafers or devices:
9031.41.00.40- - - - For wafers
9031.41.00.60- - - - Other
9031.49- - Other:
9031.49.10.00- - - Profile projectors
9031.49.40.00- - - Coordinate-measuring machines
9031.49.70.00- - - For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices
9031.49.90.00- - - Other
9031.80- Other instruments, appliances and machines:
9031.80.40.00- - Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles
9031.80.80- - Other
- - - Equipment for testing the characteristics of internal combustion engines:
9031.80.80.60- - - - For testing electrical characteristics
9031.80.80.70- - - - Other
9031.80.80.85- - - Other
9031.90- Parts and accessories:
9031.90.21.00- - Of profile projectors
- - Of other optical instruments and appliances, other than test benches:
9031.90.45.00- - - Bases and frames for the coordinate-measuring machines of subheading 9031.49.40
9031.90.54.00- - - Of optical instruments and appliances of subheading 9031.41 or 9031.49.70
9031.90.59.00- - - Other
- - Other:
9031.90.70.00- - - Of articles of subheading 9031.80.40
9031.90.91- - - Other
9031.90.91.30- - - - Of machines for balancing mechanical parts
9031.90.91.60- - - - Of test benches
9031.90.91.95- - - - Other

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