US Customs Ruling (CROSS)
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Ruling Number :
Issuing Country :
UNITED STATES
Date Of Issue : 2016-02-23T00:00:00
wafer probe card, probe interface board (PIB), and load board used for the testing of integrated circuits (“ICs”)
Qualcomm wafer probe card
Description : wafer probe card, probe interface board (PIB), and load board
Please importantly note that only the relevant portion of the related US Ruling (Cross) is displayed above. You may refer to the said customs ruling for the entire ruling explanation.
Source : US Customs Ruling (CROSS)
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