What is the HS code for wafer probers?

Q: What is the HS code for wafer probers?

The 6-digit HS code for wafer probers is 9030.82. The first 6 digits are the same in every country using the Harmonized System; the full 8-10 digit national code (e.g. EU TARIC, US HTSUS) depends on the destination country.

HS Code for wafer probers

Product

wafer probers

HS Code (6-digit)

9030.82.••.••

See full HS code

The 6-digit HS code for wafer probers is 9030.82.

The first 6 digits are the same in every country using the Harmonized System; the full 8-10 digit national code (e.g. EU TARIC, US HTSUS) depends on the destination country.

Sample products for "wafer probers"

UK Advance Tariff Rulings

HS Code :	9030.82
HS Code :	9030.82.••.••

Ruling Number :

Date Of Issue : 24.Nov.2023 - 23.Nov.2026

A combined constant current source and digital voltameter for measuring resistivity of semiconductor samples using a four-point probe, capable of displaying results as voltage, sheet resistance in ohms per square, or resistivity in ohm.cm, with currents ranging from 10nA to 100mA.

Description : This product is a unit that is a combined constant current source and digital voltameter. The user can input the desired level of constant current or choose a simple auto ranging function. The unit is used in conjunction with a four-point probe and readings can be used to determine the resistivity of semiconductor samples, typically silicon wafers or thin metal layers. Generally used in research applications the unit can be operated as a standalone unit or can be controlled by a PC using supplied software or by the user writing a program to operate it as required. The unit can also display results from measurements as voltage, as a sheet resistance in ohms per square, or as a resistivity in ohm.cm. Also offering currents between 10nA and 100mA and cannot be adjusted to offer higher or lower currents.

Source : UK Advance Tariff Rulings
source link :

US Customs Ruling (CROSS)

HS Code :	9030.82
HTS Code :	9030.82.••••

Ruling Number :

Issuing Country : UNITED STATES

Date Of Issue : 2025-05-30T00:00:00

Integrated circuit (IC) sockets used for testing semiconductor chips during manufacturing processes. These devices are mounted onto a burn-in board (BIB) or test board to ensure secure electrical contact and allow repeated insertions without damaging the chip during quality control and reliability assessments in consumer electronics, automotive, and industrial applications.

Description : integrated circuit sockets

Please importantly note that only the relevant portion of the related US Ruling (Cross) is displayed above. You may refer to the said customs ruling for the entire ruling explanation.

Source : US Customs Ruling (CROSS)
source link :

EU Binding Tariff Information

HS Code :	9030.82
CN Code :	9030.82.••.••

BTI Reference :

Issuing Country : GERMANY

Date Of Issue : 13.Jul.2026 - 12.Jul.2029

Device for measuring electrical resistance of conductive or insulating layers on semiconductor wafers, comprising a housing with wafer holding mechanism and integrated measuring technology, connected to a PC for control, display, evaluation, and data storage.

Description auto translated : So-called measuring devices for semiconductor wafers, in the form of functional units, each essentially consisting of a measuring device, which is connected via cable to a PC (sometimes with a monitor and printer) for controlling, displaying, evaluating and storing the measured values (see exemplary illustrations in the appendix). The measuring devices consist of a housing with a holding device for the semiconductor wafers and the necessary measuring technology. They are used to measure the specific electrical resistance in ohms (layer or surface resistance) of the conductive or insulating layers on semiconductor disks (wafers). The product is classified as "device for measuring or testing electrical quantities (resistance), not a meter, of heading 9028, other than subheading (HS) 9030 10 to 9030 40, as device for measuring or testing semiconductor wafers or semiconductor devices (including integrated circuits)".

Original Description: Sog. Messgeräte für Halbleiterscheiben (Wafers), in Form funktioneller Einheiten, im Wesentlichen jeweils bestehend aus einem Messgerät, welches über Kabel mit einem PC (teilweise mit Monitor und Drucker) zur Steuerung, Darstellung, Auswertung und Speicherung der Messwerte verbunden ist (siehe beispielhafte Abbildungen in der Anlage). Die Messgeräte setzen sich aus einem Gehäuse mit einer Aufnahmevorrichtung für die Halbleiterscheiben sowie der notwendigen Messtechnik zusammen. Sie dienen der Messung des spezifischen elektrischen Widerstandes in Ohm (Schicht- oder Flächenwiderstand) der leitfähigen oder isolierenden Schichten auf Halbleiterscheiben (Wafers). Die Ware wird als "Gerät zum Messen oder Prüfen elektrischer Größen (Widerstand), kein Zähler der Position 9028, anderes als Unterposition (HS) 9030 10 bis 9030 40, als Gerät zum Messen oder Prüfen von Halbleiterscheiben (wafers) oder Halbleiterbauelementen (einschließlich integrierter Schaltungen)" eingereiht.

Source : EU Binding Tariff Information
source link :